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A Modeling And Experimental Analysis Of Fractal Geometric Potential Mems In The Context Of The Development Of 6g And Beyond

Author

Listed:
  • DAN TIAN

    (School of Computer Science and Technology, Dongguan University of Technology, Dongguan, P. R. China)

  • ZIXUAN HUANG

    (��School of Electronics and Communication Engineering, Guangzhou University, Guangzhou, P. R. China)

  • JINGJING XIANG

    (��School of Science, Xi’an University of Architecture and Technology, Xi’an, P. R. China)

Abstract

In recent years, there has been a considerable increase of interest in the sixth-generation (6G) communications. The advent of 6G wireless communications will facilitate a comprehensive upgrade and transformation of the industry, enabling higher data rates, lower latency, and ubiquitous connectivity. Research on microelectromechanical systems (MEMS) is a crucial element in the advancement of 6G wireless communications. In this paper, we examine the impact of geometric potential on MEMS within the context of fractal space, where a fractal geometric potential MEMS model is proposed and the critical conditions that govern the pull-in phenomenon are elucidated. Moreover, a periodic solution of the model is proposed and compared with other numerical methods.

Suggested Citation

  • Dan Tian & Zixuan Huang & Jingjing Xiang, 2024. "A Modeling And Experimental Analysis Of Fractal Geometric Potential Mems In The Context Of The Development Of 6g And Beyond," FRACTALS (fractals), World Scientific Publishing Co. Pte. Ltd., vol. 32(06), pages 1-7.
  • Handle: RePEc:wsi:fracta:v:32:y:2024:i:06:n:s0218348x2450124x
    DOI: 10.1142/S0218348X2450124X
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