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Control charts for exponentially distributed product life

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  • Tuncel M. Yegulalp

Abstract

This paper introduces a special control chart procedure for exponentially distributed product life. Statistical control of product life in manufacturing requires continuing life tests of manufactured product so as to detect changes in product life and take appropriate corrective action. These life testing experiments may become exceedingly time consuming and thus can be both impractical because of serious time delays in implementing corrective action on the process when indicated, and quite uneconomical. It is desirable to inquire into the character of life testing by means of a control chart procedure based on the real time to first failure within given samples. Measuring the real minimum life provides a considerable reduction in duration of the testing procedure and in the number of specimens destroyed, yielding a considerable economy over the Shewhart's X control chart.

Suggested Citation

  • Tuncel M. Yegulalp, 1975. "Control charts for exponentially distributed product life," Naval Research Logistics Quarterly, John Wiley & Sons, vol. 22(4), pages 697-712, December.
    • Handle: RePEc:wly:navlog:v:22:y:1975:i:4:p:697-712
    DOI: 10.1002/nav.3800220406
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    Cited by:

    1. Chi Zhang & Fugee Tsung & Dongdong Xiang, 2016. "Monitoring censored lifetime data with a weighted‐likelihood scheme," Naval Research Logistics (NRL), John Wiley & Sons, vol. 63(8), pages 631-646, December.

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