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An Analysis of Applicability using Quality Metrics for Ontologies on Ontology Design Patterns

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  • Birger Lantow
  • Kurt Sandkuhl

Abstract

Ontology design patterns (ODPs) provide best‐practice solutions for common or recurring ontology design problems. This work focuses on content ODPs, which form small ontologies themselves and thus can be subject to ontology quality metrics in general. We investigate the use of such metrics for content ODP evaluation in terms of metrics applicability and validity. The quality metrics used for this investigation are taken from existing work in the area of ontology quality evaluation. We discuss the general applicability to content ODP of each metric considering its definition, ODP characteristics, and the defined goals of ODPs. The research process presented in this paper has two phases. In the first phase, we conducted a literature research in the area of metrics for assessing ontology quality. The second phase consisted of a two‐step evaluation of the ontology metrics identified in the literature analysis. During the first step, we investigated whether the metrics are appropriate to differentiate between content ODPs of different quality. Metrics that proved to be applicable were calculated for a random set of 14 content ODPs. In the second step, a controlled experiment, the quality indicated by the metric value was contrasted with the perception of ontology engineers; that is, do ‘measured quality’ and ‘perceived quality’ match?. Copyright © 2015 John Wiley & Sons, Ltd.

Suggested Citation

  • Birger Lantow & Kurt Sandkuhl, 2015. "An Analysis of Applicability using Quality Metrics for Ontologies on Ontology Design Patterns," Intelligent Systems in Accounting, Finance and Management, John Wiley & Sons, Ltd., vol. 22(1), pages 81-99, January.
    • Handle: RePEc:wly:isacfm:v:22:y:2015:i:1:p:81-99
    DOI: 10.1002/isaf.1360
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    References listed on IDEAS

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    1. Aldo Gangemi & Valentina Presutti, 2009. "Ontology Design Patterns," International Handbooks on Information Systems, in: Steffen Staab & Rudi Studer (ed.), Handbook on Ontologies, pages 221-243, Springer.
    2. Nicola Guarino & Christopher A. Welty, 2009. "An Overview of OntoClean," International Handbooks on Information Systems, in: Steffen Staab & Rudi Studer (ed.), Handbook on Ontologies, pages 201-220, Springer.
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    Cited by:

    1. Tania Wallis & Rafał Leszczyna, 2022. "EE-ISAC—Practical Cybersecurity Solution for the Energy Sector," Energies, MDPI, vol. 15(6), pages 1-23, March.

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