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Methods for planning repeated measures accelerated degradation tests

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  • Brian P. Weaver
  • William Q. Meeker

Abstract

Repeated measures accelerated degradation tests can sometimes be used to assess product or component reliability when one would expect few or even no failures during a study. Such tests can be used to estimate the lifetime distributions of highly reliable items. This paper describes methods for selecting a single‐variable accelerated repeated measures degradation test plan when the (possibly transformed) degradation that is linear in (possibly transformed) time and unit‐to‐unit variability is described by a random‐effects model. To find optimum test plans, we use a criterion based on a large‐sample approximation to the estimation precision of a quantile of the failure‐time distribution at use conditions. We also discuss how to find compromise test plans that satisfy practical constraints. We use the general equivalence theorem to verify that a test plan is globally optimum. The resulting optimized plans are also evaluated using simulation and compared with other test plans. Copyright © 2014 John Wiley & Sons, Ltd.

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  • Brian P. Weaver & William Q. Meeker, 2014. "Methods for planning repeated measures accelerated degradation tests," Applied Stochastic Models in Business and Industry, John Wiley & Sons, vol. 30(6), pages 658-671, November.
    • Handle: RePEc:wly:apsmbi:v:30:y:2014:i:6:p:658-671
    DOI: 10.1002/asmb.2061
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    Cited by:

    1. Wang, Han & Zhao, Yu & Ma, Xiaobing & Wang, Hongyu, 2017. "Optimal design of constant-stress accelerated degradation tests using the M-optimality criterion," Reliability Engineering and System Safety, Elsevier, vol. 164(C), pages 45-54.
    2. Zhu, Xiaoyan & Hao, Yaqian, 2021. "Component rearrangement and system replacement for a system with stochastic degradation processes," Reliability Engineering and System Safety, Elsevier, vol. 213(C).

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