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Efficiency measure, modelling and estimation in combined array designs

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  • Tak Mak
  • Fassil Nebebe

Abstract

In off‐line quality control, the settings that minimize the variance of a quality characteristic are unknown and must be determined based on an estimated dual response model of mean and variance. The present paper proposes a direct measure of the efficiency of any given design‐estimation procedure for variance minimization. This not only facilitates the comparison of different design‐estimation procedures, but may also provide a guideline for choosing a better solution when the estimated dual response model suggests multiple solutions. Motivated by the analysis of an industrial experiment on spray painting, the present paper also applies a class of link functions to model process variances in off‐line quality control. For model fitting, a parametric distribution is employed in updating the variance estimates used in an iteratively weighted least squares procedure for mean estimation. In analysing combined array experiments, Engel and Huele (Technometrics, 1996; 39:365) used log‐link to model process variances and considered an iteratively weighted least squares leading to the pseudo‐likelihood estimates of variances as discussed in Carroll and Ruppert (Transformation and Weighting in Regression, Chapman & Hall: New York). Their method is a special case of the approach considered in this paper. It is seen for the spray paint data that the log‐link may not be satisfactory and the class of link functions considered here improves substantially the fit to process variances. This conclusion is reached with a suggested method of comparing ‘empirical variances’ with the ‘theoretical variances’ based on the assumed model. Copyright © 2003 John Wiley & Sons, Ltd.

Suggested Citation

  • Tak Mak & Fassil Nebebe, 2003. "Efficiency measure, modelling and estimation in combined array designs," Applied Stochastic Models in Business and Industry, John Wiley & Sons, vol. 19(4), pages 315-326, October.
  • Handle: RePEc:wly:apsmbi:v:19:y:2003:i:4:p:315-326
    DOI: 10.1002/asmb.504
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