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Statistical concepts of capability of detection

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  • Peter‐Th. Wilrich

Abstract

The minimum detectable value of a measurement system is the smallest true value of the measurand X that can be detected as distinct from the true value x = 0 with a specified probability 1−β. If the measurand X is measured indirectly and the directly measurable variable Y is linearly related to X, the minimum detectable value depends on the design of the measurement system, i.e. the calibration experiment for the estimation of the linear relationship and the number of repeated measurements of the sample. In this paper a design is derived that assures the minimum detectable value to be equal to a specified value. Copyright © 2002 John Wiley & Sons, Ltd.

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  • Peter‐Th. Wilrich, 2002. "Statistical concepts of capability of detection," Applied Stochastic Models in Business and Industry, John Wiley & Sons, vol. 18(3), pages 339-346, July.
    • Handle: RePEc:wly:apsmbi:v:18:y:2002:i:3:p:339-346
    DOI: 10.1002/asmb.483
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    Cited by:

    1. D. Zappa & L. Deldossi, 2009. "Misclassification rates, critical values and size of the design in measurement systems capability studies," Applied Stochastic Models in Business and Industry, John Wiley & Sons, vol. 25(5), pages 601-611, September.

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