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Observance And Development Of Salient Quality Overprint For Tablecloths Embroidery With Use Of Rfid Technology

Author

Listed:
  • Mgr. Jana Strauszová Ph.D

    (Alexander Dubček Univeristy of Trenčín, Slovak Republic)

  • prof . Ing. Kristína Zgodavová, PhD

    (Alexander Dubček Univeristy of Trenčín, Slovak Republic)

Abstract

Mission of this paper is to enable those interested in observance and development quality embroidery typical of the region use with RFID technologies for designing, implementing and providing overprint for tablecloths embroidery. The starting point is present situation and method of observance and development of overprint embroidery. The solution is in scanning of patterns and their saving into database of industrial patterns with implemented RFID tag. This will allow indentifying, evaluating and using overprint for tablecloths embroidery. RFID technology can be applied for observance and development of salient quality any products of individual, organizations and their protected pattern and support creative and innovative acting of individuals and organizations in region. The paper is intended especially for specialists, who are interested in issue observance salient quality in sense of cultural heritage of regions. The paper has been compiled in connection with resolving project KEGA 3/6411/08 Transformation of the already existing study programme Management of production quality to a university-wide bilingual study programme.

Suggested Citation

  • Mgr. Jana Strauszová Ph.D & prof . Ing. Kristína Zgodavová, PhD, 2010. "Observance And Development Of Salient Quality Overprint For Tablecloths Embroidery With Use Of Rfid Technology," Quality Innovation Prosperity, Technical University of Košice, Department of integrated management, vol. 14(1-2).
    • Handle: RePEc:tuk:qipqip:v:14:y:2010:i:1-2:6
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    Keywords

    saliency of quality; embroidery; industrial pattern; tablecloths embroidery; RFID technology;
    All these keywords.

    JEL classification:

    • Z - Other Special Topics

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