IDEAS home Printed from https://ideas.repec.org/a/taf/uiiexx/v44y2012i9p754-764.html
   My bibliography  Save this article

Step-stress accelerated life tests: a proportional hazards–based non-parametric model

Author

Listed:
  • Cheng-Hung Hu
  • Robert Plante
  • Jen Tang

Abstract

Using data from a simple step-stress accelerated life test procedure, a non-parametric proportional hazards model is proposed for obtaining upper confidence bounds for the cumulative failure probability of a product under normal use conditions. The approach is non-parametric in the sense that most of the functions involved in the model do not assume any specific forms, except for certain verifiable conditions. Test statistics are introduced to verify assumptions about the model and to test the goodness of fit of the proposed model to the data. A numerical example, using data simulated from the lifetime distribution of an existing parametric study on metal-oxide semiconductor capacitors, is used to illustrate the proposed methods. Discussions on how to determine the optimal stress levels and sample size are also given.

Suggested Citation

  • Cheng-Hung Hu & Robert Plante & Jen Tang, 2012. "Step-stress accelerated life tests: a proportional hazards–based non-parametric model," IISE Transactions, Taylor & Francis Journals, vol. 44(9), pages 754-764.
    • Handle: RePEc:taf:uiiexx:v:44:y:2012:i:9:p:754-764
    DOI: 10.1080/0740817X.2011.596508
    as

    Download full text from publisher

    File URL: http://hdl.handle.net/10.1080/0740817X.2011.596508
    Download Restriction: Access to full text is restricted to subscribers.
    File URL: https://libkey.io/10.1080/0740817X.2011.596508?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    Citations

    Citations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
    as


    Cited by:

    1. Wu, Shuo-Jye & Huang, Syuan-Rong, 2017. "Planning two or more level constant-stress accelerated life tests with competing risks," Reliability Engineering and System Safety, Elsevier, vol. 158(C), pages 1-8.
    2. Liu, Bin & Shi, Yimin & Ng, Hon Keung Tony & Shang, Xiangwen, 2021. "Nonparametric Bayesian reliability analysis of masked data with dependent competing risks," Reliability Engineering and System Safety, Elsevier, vol. 210(C).
    3. Moustafa, Kassem & Hu, Zhen & Mourelatos, Zissimos P. & Baseski, Igor & Majcher, Monica, 2021. "System reliability analysis using component-level and system-level accelerated life testing," Reliability Engineering and System Safety, Elsevier, vol. 214(C).

    More about this item

    Statistics

    Access and download statistics

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:taf:uiiexx:v:44:y:2012:i:9:p:754-764. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Chris Longhurst (email available below). General contact details of provider: http://www.tandfonline.com/uiie .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.