IDEAS home Printed from https://ideas.repec.org/a/taf/uiiexx/v41y2009i7p605-614.html
   My bibliography  Save this article

Sensor fault detection for manufacturing quality control

Author

Listed:
  • Shan Li
  • Yong Chen

Abstract

This paper proposes a W control chart that is able to detect sensor mean shift faults and distinguish them from potential process faults in discrete-part manufacturing processes. The control chart is set up based on a linear fault quality model. The sensitivity of the W chart to the occurrence of sensor faults is studied. An index called the sensitivity ratio is used to investigate the effects of sensor fault locations and the sensor layout on the sensitivity of the W chart to sensor faults. In comparison with traditional control charts, which directly monitor the product quality characteristics, the proposed W chart can effectively separate sensor faults from process faults. An automotive body assembly process is used as an example to demonstrate the performance of the W chart.[Supplementary materials are available for this article. Go to the publisher's online edition of IIE Transactions for the following free supplemental resource: Appendix]

Suggested Citation

  • Shan Li & Yong Chen, 2009. "Sensor fault detection for manufacturing quality control," IISE Transactions, Taylor & Francis Journals, vol. 41(7), pages 605-614.
  • Handle: RePEc:taf:uiiexx:v:41:y:2009:i:7:p:605-614
    DOI: 10.1080/07408170802389290
    as

    Download full text from publisher

    File URL: http://hdl.handle.net/10.1080/07408170802389290
    Download Restriction: Access to full text is restricted to subscribers.

    File URL: https://libkey.io/10.1080/07408170802389290?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    Citations

    Citations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
    as


    Cited by:

    1. Yoo, Minji & Kim, Taejin & Yoon, Joung Taek & Kim, Yunhan & Kim, Sooho & Youn, Byeng D., 2020. "A resilience measure formulation that considers sensor faults," Reliability Engineering and System Safety, Elsevier, vol. 199(C).

    More about this item

    Statistics

    Access and download statistics

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:taf:uiiexx:v:41:y:2009:i:7:p:605-614. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Chris Longhurst (email available below). General contact details of provider: http://www.tandfonline.com/uiie .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.