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Automatic virtual metrology for wheel machining automation

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  • Haw-Ching Yang
  • Hao Tieng
  • Fan-Tien Cheng

Abstract

Total inspection after wheel machining becomes essential for safety consideration and continuous improvement. However, conducting wheel-by-wheel actual metrology is very expensive and time-consuming. A novel idea is to use virtual metrology (VM) that predicts wheel quality based on process data collected from machine tool with a slight supplement of actual metrology data. The technology of automatic virtual metrology (AVM) has been proposed by the authors and successfully deployed in hi-tech industries, such as semiconductor, display and solar cell. The purpose of this study was to propose an approach to apply the AVM system factory-wide to wheel machining automation (WMA) for achieving total inspection of all the precision items of WMA under mass production environment.

Suggested Citation

  • Haw-Ching Yang & Hao Tieng & Fan-Tien Cheng, 2016. "Automatic virtual metrology for wheel machining automation," International Journal of Production Research, Taylor & Francis Journals, vol. 54(21), pages 6367-6377, November.
    • Handle: RePEc:taf:tprsxx:v:54:y:2016:i:21:p:6367-6377
    DOI: 10.1080/00207543.2015.1109724
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