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Dual response surface optimization using a process “capability” index

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  • Michael Bendersky
  • Noam Barak
  • Yisrael Parmet

Abstract

Dual Response Surface Methodology is a powerful tool for simultaneously optimizing the mean and the variance of a quality characteristic in the field of quality engineering. The optimization of dual response systems to achieve better quality has played a major role in the design of industrial products and processes. In this paper we suggest using a process capability index - Cpk - as the objective function. We show by ways of multiple examples that this method improves the obtained yield of a process for different response variable types.

Suggested Citation

  • Michael Bendersky & Noam Barak & Yisrael Parmet, 2022. "Dual response surface optimization using a process “capability” index," Communications in Statistics - Theory and Methods, Taylor & Francis Journals, vol. 51(20), pages 7006-7020, October.
    • Handle: RePEc:taf:lstaxx:v:51:y:2022:i:20:p:7006-7020
    DOI: 10.1080/03610926.2020.1869990
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