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Constant Stress Accelerated Life Test on a Multiple-Component Series System under Weibull Lifetime Distributions

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  • Tsai-hung Fan
  • Tsung-ming Hsu

Abstract

We will discuss the reliability analysis of the constant stress accelerated life test on a series system connected with multiple components under independent Weibull lifetime distributions whose scale parameters are log-linear in the level of the stress variable. The system lifetimes are collected under Type I censoring but the components that cause the systems to fail may or may not be observed. The data are so called masked for the latter case. Maximum likelihood approach and the Bayesian method are considered when the data are masked. Statistical inference on the estimation of the underlying model parameters as well as the mean time to failure and the reliability function will be addressed. Simulation study for a three-component case shows that Bayesian analysis outperforms the maximum likelihood approach especially when the data are highly masked.

Suggested Citation

  • Tsai-hung Fan & Tsung-ming Hsu, 2014. "Constant Stress Accelerated Life Test on a Multiple-Component Series System under Weibull Lifetime Distributions," Communications in Statistics - Theory and Methods, Taylor & Francis Journals, vol. 43(10-12), pages 2370-2383, May.
    • Handle: RePEc:taf:lstaxx:v:43:y:2014:i:10-12:p:2370-2383
    DOI: 10.1080/03610926.2013.809115
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    Cited by:

    1. Jia, Xiang & Wang, Dong & Jiang, Ping & Guo, Bo, 2016. "Inference on the reliability of Weibull distribution with multiply Type-I censored data," Reliability Engineering and System Safety, Elsevier, vol. 150(C), pages 171-181.

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