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Adjusted-loss-function charts with variable sample sizes and sampling intervals

Author

Listed:
  • Zhang Wu
  • Yu Tian
  • Sheng Zhang

Abstract

Recent research has shown that the control charts with adaptive features are quicker than the traditional static Shewhart charts in detecting process shifts. This article presents the design and implementation of a control chart based on Adjusted Loss Function (AL) with Variable Sample Sizes and Sampling Intervals (VSSI). This single chart (called the VSSI AL chart) is able to monitor the process shifts in mean and variance simultaneously. Our studies show that the VSSI AL chart is not only easier to design and implement than the VSSI X & S (or X & R) charts, but is also 10% more effective than the latter in detecting the process shifts from an overall viewpoint.

Suggested Citation

  • Zhang Wu & Yu Tian & Sheng Zhang, 2005. "Adjusted-loss-function charts with variable sample sizes and sampling intervals," Journal of Applied Statistics, Taylor & Francis Journals, vol. 32(3), pages 221-242.
    • Handle: RePEc:taf:japsta:v:32:y:2005:i:3:p:221-242
    DOI: 10.1080/02664760500054475
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    Citations

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    Cited by:

    1. Wu, Zhang & Yang, Mei & Jiang, Wei & Khoo, Michael B.C., 2008. "Optimization designs of the combined Shewhart-CUSUM control charts," Computational Statistics & Data Analysis, Elsevier, vol. 53(2), pages 496-506, December.
    2. Lim, S.L. & Khoo, Michael B.C. & Teoh, W.L. & Xie, M., 2015. "Optimal designs of the variable sample size and sampling interval X¯ chart when process parameters are estimated," International Journal of Production Economics, Elsevier, vol. 166(C), pages 20-35.
    3. Bock, David, 2007. "Consequences of using the probability of a false alarm as the false alarm measure," Research Reports 2007:3, University of Gothenburg, Statistical Research Unit, School of Business, Economics and Law.
    4. David Bock, 2008. "Aspects on the control of false alarms in statistical surveillance and the impact on the return of financial decision systems," Journal of Applied Statistics, Taylor & Francis Journals, vol. 35(2), pages 213-227.

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