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Statistical analysis of process capability indices with measurement errors: The case ofC p

Author

Listed:
  • Silvano Bordignon

    (Dipartimento di Scienze Statistiche)

  • Michele Scagliarini

    (Dipartimento di Scienze Statistiche Via Belle Arti 41)

Abstract

Process capability indices (PCIs) have been widely used in manufacturing industries to previde a quantitative measure of process potential and performance. While some efforts have been dedicated in the literature to the statistical properties of PCIs estimators, scarce attention has been given to the evaluation of these properties when sample data are affected by measurement errors. In this work we deal with the problem of measurement errors effects on the performance of PCIs. The analysis is illustrated with reference toC p , i.e. the simplest and most common measure suggested to evaluate process capability.

Suggested Citation

  • Silvano Bordignon & Michele Scagliarini, 2001. "Statistical analysis of process capability indices with measurement errors: The case ofC p," Statistical Methods & Applications, Springer;Società Italiana di Statistica, vol. 10(1), pages 273-285, January.
    • Handle: RePEc:spr:stmapp:v:10:y:2001:i:1:d:10.1007_bf02511652
    DOI: 10.1007/BF02511652
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