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Three-stage confidence intervals for a linear combination of locations of two negative exponential distributions

Author

Listed:
  • Eiichi Isogai

    (Niigata University)

  • Chikara Uno

    (Akita University)

Abstract

Mukhopadhyay and Padmanabhan (Metrika 40:121–128, 1993) considered the construction of fixed-width confidence intervals for the difference of location parameters of two negative exponential distributions via triple sampling when the scale parameters are unknown and unequal. Under the same setting, this paper deals with the problem of fixed-width confidence interval estimation for a linear combination of location parameters, using the above mentioned three-stage procedure.

Suggested Citation

  • Eiichi Isogai & Chikara Uno, 2018. "Three-stage confidence intervals for a linear combination of locations of two negative exponential distributions," Metrika: International Journal for Theoretical and Applied Statistics, Springer, vol. 81(1), pages 85-103, January.
    • Handle: RePEc:spr:metrik:v:81:y:2018:i:1:d:10.1007_s00184-017-0635-y
    DOI: 10.1007/s00184-017-0635-y
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    References listed on IDEAS

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    1. M. Son & L. Haugh & H. Hamdy & M. Costanza, 1997. "Controlling Type II Error While Constructing Triple Sampling Fixed Precision Confidence Intervals for the Normal Mean," Annals of the Institute of Statistical Mathematics, Springer;The Institute of Statistical Mathematics, vol. 49(4), pages 681-692, December.
    2. N. Mukhopadhyay & A. Padmanabhan, 1993. "A note on three-stage confidence intervals for the difference of locations: The exponential case," Metrika: International Journal for Theoretical and Applied Statistics, Springer, vol. 40(1), pages 121-128, December.
    3. N. Mukhopadhyay & A. Mauromoustakos, 1987. "Three-stage estimation procedures for the negative exponential distributions," Metrika: International Journal for Theoretical and Applied Statistics, Springer, vol. 34(1), pages 83-93, December.
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