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Correction: Natural language processing (NLP) and association rules (AR)-based knowledge extraction for intelligent fault analysis: a case study in semiconductor industry

Author

Listed:
  • Zhiqiang Wang

    (Léonard de Vinci Pôle Universitaire, Kenneth Ezukwoke)

  • Kenneth Ezukwoke

    (Mines Saint-Étienne, Univ. Clermont Auvergne, CNRS UMR 6158 LIMOS
    Henri FAYOL Institute)

  • Anis Hoayek

    (Mines Saint-Étienne, Univ. Clermont Auvergne, CNRS UMR 6158 LIMOS
    Henri FAYOL Institute)

  • Mireille Batton-Hubert

    (Mines Saint-Étienne, Univ. Clermont Auvergne, CNRS UMR 6158 LIMOS
    Henri FAYOL Institute)

  • Xavier Boucher

    (Mines Saint-Étienne, Univ. Clermont Auvergne, CNRS UMR 6158 LIMOS
    Center for Biomedical and Healthcare Engineering)

Abstract

No abstract is available for this item.

Suggested Citation

  • Zhiqiang Wang & Kenneth Ezukwoke & Anis Hoayek & Mireille Batton-Hubert & Xavier Boucher, 2025. "Correction: Natural language processing (NLP) and association rules (AR)-based knowledge extraction for intelligent fault analysis: a case study in semiconductor industry," Journal of Intelligent Manufacturing, Springer, vol. 36(1), pages 373-373, January.
    • Handle: RePEc:spr:joinma:v:36:y:2025:i:1:d:10.1007_s10845-023-02310-1
    DOI: 10.1007/s10845-023-02310-1
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