Automated detection of defects with low semantic information in X-ray images based on deep learning
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DOI: 10.1007/s10845-020-01566-1
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Cited by:
- Minyoung Lee & Joohyoung Jeon & Hongchul Lee, 2022. "Explainable AI for domain experts: a post Hoc analysis of deep learning for defect classification of TFT–LCD panels," Journal of Intelligent Manufacturing, Springer, vol. 33(6), pages 1747-1759, August.
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Keywords
Defect detection; Casting parts; Deep learning; X-ray image; Computer vision;All these keywords.
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