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Fault isolation by test scheduling for embedded systems using a probabilistic approach

Author

Listed:
  • Daoud Aït-Kadi

    (Université Laval)

  • Zineb Simeu-Abazi

    (Université Joseph Fourier)

  • Ahmed Arous

    (Université Laval)

Abstract

This paper deals with isolation of failed components in the system. Each component can be affected in a random way by failures. The state of a component or a subsystem is detected using tests. The goal of this paper is to exploit the techniques of built-in tests and available knowledge to generate the sequence of tests required to locate quickly all the components responsible for system failure. We consider an operative system according to a series structure for which we know test cost and the conditional probability that a component is responsible for the failure. The various diagnosis strategies are analyzed. The treated algorithms relay on system probabilistic analysis.

Suggested Citation

  • Daoud Aït-Kadi & Zineb Simeu-Abazi & Ahmed Arous, 2018. "Fault isolation by test scheduling for embedded systems using a probabilistic approach," Journal of Intelligent Manufacturing, Springer, vol. 29(3), pages 641-649, March.
    • Handle: RePEc:spr:joinma:v:29:y:2018:i:3:d:10.1007_s10845-015-1088-7
    DOI: 10.1007/s10845-015-1088-7
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    References listed on IDEAS

    as
    1. Brian Gluss, 1959. "An Optimum Policy for Detecting a Fault in a Complex System," Operations Research, INFORMS, vol. 7(4), pages 468-477, August.
    2. Simeu-Abazi, Zineb & Lefebvre, Arnaud & Derain, Jean-Pierre, 2011. "A methodology of alarm filtering using dynamic fault tree," Reliability Engineering and System Safety, Elsevier, vol. 96(2), pages 257-266.
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