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Early software reliability analysis using reliability relevant software metrics

Author

Listed:
  • Harikesh Bahadur Yadav

    (National Institute of Technology)

  • Dilip Kumar Yadav

    (National Institute of Technology)

Abstract

The early software reliability analysis is very useful for improving the quality of software at reduced testing effort. Software defect density indicator predicted in the early phases (requirement analysis, design and coding phases) provides an opportunity for the early identification of cost overrun, software development process issues and optimal development strategies. Failure data is not available in the early phases of the software development life cycle (SDLC). However, qualitative values of software metrics are available in the early phases of SDLC. Therefore, in this paper, a model is proposed to predict the software defect density indicator of early phases of SDLC using fuzzy logic and the reliability relevant software metrics of early artifacts. The proposed model is applied on twenty real software projects. It is observed that the requirement analysis phase defect density indicator value is relatively greater than that of the design and coding artifacts. The model is validated with the existing literature. Validation result is satisfactory.

Suggested Citation

  • Harikesh Bahadur Yadav & Dilip Kumar Yadav, 2017. "Early software reliability analysis using reliability relevant software metrics," International Journal of System Assurance Engineering and Management, Springer;The Society for Reliability, Engineering Quality and Operations Management (SREQOM),India, and Division of Operation and Maintenance, Lulea University of Technology, Sweden, vol. 8(4), pages 2097-2108, December.
    • Handle: RePEc:spr:ijsaem:v:8:y:2017:i:4:d:10.1007_s13198-014-0325-3
    DOI: 10.1007/s13198-014-0325-3
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    Cited by:

    1. Jung, Sejin & Yoo, Junbeom & Lee, Young-Jun, 2020. "A Software Fault Tree Analysis Technique for Formal Requirement Specifications of Nuclear Reactor Protection Systems," Reliability Engineering and System Safety, Elsevier, vol. 203(C).

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