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A multi-step approach for reliability-based robust design optimization of truss structures

Author

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  • Hashem Mehanpour
  • Seyed Rohollah Hoseini Vaez
  • Mohammad Ali Fathali

Abstract

There are two general methods of robust design optimization (RDO) and reliability-based robust design optimization (RBRDO) for the optimal design of structures with non-deterministic variables. In the problem-solving process of both RDO and RBRDO, assessing the probabilistic constraints of the problem and the standard deviation of the structural responses is time-consuming and costly. In this study, by presenting a multi-step approach, for a probable optimal solution, the deterministic constraints are first investigated. Then the limit state functions related to probabilistic constraints are computed based on the mean value of random variables (in the RBRDO problem) and in the step of uncertainties effects simulation on the response of the structure, probabilistic constraints are evaluated (in the RBRDO problem). Designs that not meeting the deterministic constraints or in the unsafe area for the mean values of the random variables are not included in calculating the first and second terms of the objective function and reliability assessment. This leads to reduce the volume of calculations. The Monte Carlo simulation method is used to assess the probabilistic constraints, and the EVPS metaheuristic algorithm is used for the optimization process. Three benchmark trusses of 10, 25, and 72 bars were studied to assess the efficiency of the proposed approach. The first objective function in these problems was the mean weight of trusses and the second objective function was the standard deviation of the displacement of a specific node in a certain direction.

Suggested Citation

  • Hashem Mehanpour & Seyed Rohollah Hoseini Vaez & Mohammad Ali Fathali, 2024. "A multi-step approach for reliability-based robust design optimization of truss structures," Journal of Risk and Reliability, , vol. 238(3), pages 654-674, June.
  • Handle: RePEc:sae:risrel:v:238:y:2024:i:3:p:654-674
    DOI: 10.1177/1748006X231152633
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