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A binary decision diagram method for phased mission analysis of non-repairable systems

Author

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  • S. J. Dunnett
  • J. D. Andrews

Abstract

Phased mission analysis is carried out to predict the reliability of systems which undergo a series of phases, each with differing requirements for success, with the mission objective being achieved only on the successful completion of all phases. Many systems from a range of industries experience such missions. The methods used for phased mission analysis are dependent upon the repairability of the system during the phases. If the system is non-repairable, fault-tree-based methods offer an efficient solution. For repairable systems, Markov approaches can be used. This paper is concerned with the analysis of non-repairable systems. When the phased mission failure causes are represented using fault trees, it is shown that the binary decision diagram (BDD) method of analysis offers advantages in the solution process. A new way in which BDD models can be efficiently developed for phased mission analysis is proposed. The paper presents a methodology by which the phased mission models can be developed and analysed to produce the phase failure modes and the phase failure likelihoods.

Suggested Citation

  • S. J. Dunnett & J. D. Andrews, 2006. "A binary decision diagram method for phased mission analysis of non-repairable systems," Journal of Risk and Reliability, , vol. 220(2), pages 93-104, December.
    • Handle: RePEc:sae:risrel:v:220:y:2006:i:2:p:93-104
    DOI: 10.1243/1748006XJRR27
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