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On designing a new cumulative sum Wilcoxon signed rank chart for monitoring process location

Author

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  • Muhammad Abid
  • Hafiz Zafar Nazir
  • Muhammad Tahir
  • Muhammad Riaz

Abstract

In this paper, ranked set sampling is used for developing a non-parametric location chart which is developed on the basis of Wilcoxon signed rank statistic. The average run length and some other characteristics of run length are used as the measures to assess the performance of the proposed scheme. Some selective distributions including Laplace (or double exponential), logistic, normal, contaminated normal and student’s t-distributions are considered to examine the performance of the proposed Wilcoxon signed rank control chart. It has been observed that the proposed scheme shows superior shift detection ability than some of the competing counterpart schemes covered in this study. Moreover, the proposed control chart is also implemented and illustrated with a real data set.

Suggested Citation

  • Muhammad Abid & Hafiz Zafar Nazir & Muhammad Tahir & Muhammad Riaz, 2018. "On designing a new cumulative sum Wilcoxon signed rank chart for monitoring process location," PLOS ONE, Public Library of Science, vol. 13(4), pages 1-18, April.
    • Handle: RePEc:plo:pone00:0195762
    DOI: 10.1371/journal.pone.0195762
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    References listed on IDEAS

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    1. Amer Ibrahim Al-Omari & Abdul Haq, 2012. "Improved quality control charts for monitoring the process mean, using double-ranked set sampling methods," Journal of Applied Statistics, Taylor & Francis Journals, vol. 39(4), pages 745-763, August.
    2. Hassen Muttlak & Walid Al-Sabah, 2003. "Statistical quality control based on ranked set sampling," Journal of Applied Statistics, Taylor & Francis Journals, vol. 30(9), pages 1055-1078.
    3. Mu'azu Abujiya & Hassen Muttlak, 2004. "Quality Control Chart for the Mean using Double Ranked Set Sampling," Journal of Applied Statistics, Taylor & Francis Journals, vol. 31(10), pages 1185-1201.
    4. Rashid Mehmood & Muhammad Riaz & Ronald Does, 2013. "Control charts for location based on different sampling schemes," Journal of Applied Statistics, Taylor & Francis Journals, vol. 40(3), pages 483-494.
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    Cited by:

    1. Khanittha Talordphop & Yupaporn Areepong & Saowanit Sukparungsee, 2023. "Design and Analysis of Extended Exponentially Weighted Moving Average Signed-Rank Control Charts for Monitoring the Process Mean," Mathematics, MDPI, vol. 11(21), pages 1-15, October.

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