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Economical sampling plans with warranty based on truncated data from Burr type XII distribution

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  • Tzong-Ru Tsai

    (Tamkang University, New Taipei City, Taiwan)

  • Yuhlong Lio

    (University of South Dakota, Vermillion, USA)

  • Nan Jiang

    (University of South Dakota, Vermillion, USA)

  • Yu-Jau Lin

    (Chung Yuan Christian University, Chung Li City, Taiwan)

  • Ya-Yen Fan

    (Tamkang University, New Taipei City, Taiwan)

Abstract

Economical sampling plans to ensure the qualities of Burr type XII distributed lifetimes were established using a truncated life test. The Bayesian inference method was used to address the lot-to-lot variation of products. The sampling plan was characterized by the sample size and the acceptance number to minimize the expected total cost. A simple empirical Bayesian estimation method was provided to estimate the hyperparameters of prior distribution, and simulation studies were conducted to validate the proposed empirical Bayesian estimation method. Lastly, the application of this proposed method was illustrated using two examples.

Suggested Citation

  • Tzong-Ru Tsai & Yuhlong Lio & Nan Jiang & Yu-Jau Lin & Ya-Yen Fan, 2015. "Economical sampling plans with warranty based on truncated data from Burr type XII distribution," Journal of the Operational Research Society, Palgrave Macmillan;The OR Society, vol. 66(9), pages 1511-1518, September.
    • Handle: RePEc:pal:jorsoc:v:66:y:2015:i:9:p:1511-1518
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