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Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing

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  • A F J van Raan
  • J G M van der Velde

Abstract

An exploratory bibliometric analysis of an R&D field (integrated circuit design testing) had the aim of visualizing the field's knowledge structure, and changes over time. It used bibliometric cartography based on co-word analysis. The basic approach and its relation with self-organizing systems are outlined; this includes the techniques for defining the field, drawing on publications (there being few patents for inclusion). Copyright , Beech Tree Publishing.

Suggested Citation

  • A F J van Raan & J G M van der Velde, 1992. "Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing," Research Evaluation, Oxford University Press, vol. 2(2), pages 103-110, August.
    • Handle: RePEc:oup:rseval:v:2:y:1992:i:2:p:103-110
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    File URL: http://hdl.handle.net/10.1093/rev/2.2.103
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    Cited by:

    1. emmanuel HASSAN, 2002. "Simultaneous mapping of interactions between S&T knowledge bases: The case of space communications," Industrial Organization 0205002, University Library of Munich, Germany.

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