IDEAS home Printed from https://ideas.repec.org/a/oup/rseval/v10y2001i1p33-45.html
   My bibliography  Save this article

Monitoring technology trends through patent analysis: a case study of thin film

Author

Listed:
  • Sujit Bhattacharya
  • Moh'd Taiyab Rashid Khan

Abstract

The trends and directions of an important area, thin film technology, is explored through analysis of US patents, comparing activity in 1989, 1993 and 1997, and 1993–1997 in detail. A classification system for all the patents in our data set under technological sector(s) and subsector(s) helps determine the major application areas of thin film technology, and thence broader subunits. The commonality and specificity of these sub-units over the time periods are delineated. The profiles of companies active in this technology are examined, including major application areas, changes in their application profile over the time periods, their main operational areas, international rankings, etc. Detailed inspection of the profile in 1993–1997 shows what the future trend might be in this technology. Copyright , Beech Tree Publishing.

Suggested Citation

  • Sujit Bhattacharya & Moh'd Taiyab Rashid Khan, 2001. "Monitoring technology trends through patent analysis: a case study of thin film," Research Evaluation, Oxford University Press, vol. 10(1), pages 33-45, April.
    • Handle: RePEc:oup:rseval:v:10:y:2001:i:1:p:33-45
    as

    Download full text from publisher

    File URL: http://hdl.handle.net/10.3152/147154401781777187
    Download Restriction: Access to full text is restricted to subscribers.
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    Citations

    Citations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
    as


    Cited by:

    1. Momeni, Abdolreza & Rost, Katja, 2016. "Identification and monitoring of possible disruptive technologies by patent-development paths and topic modeling," Technological Forecasting and Social Change, Elsevier, vol. 104(C), pages 16-29.
    2. Martin Meyer & Sujit Bhattacharya, 2004. "Commonalities and differences between scholarly and technical collaboration," Scientometrics, Springer;Akadémiai Kiadó, vol. 61(3), pages 443-456, November.
    3. Sujit Bhattacharya & Martin Meyer, 2003. "Large firms and the science-technology interface Patents, patent citations, and scientific output of multinational corporations in thin films," Scientometrics, Springer;Akadémiai Kiadó, vol. 58(2), pages 265-279, October.
    4. Sujit Bhattacharya & Hildrun Kretschmer & Martin Meyer, 2003. "Characterizing intellectual spaces between science and technology," Scientometrics, Springer;Akadémiai Kiadó, vol. 58(2), pages 369-390, October.

    More about this item

    Statistics

    Access and download statistics

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:oup:rseval:v:10:y:2001:i:1:p:33-45. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Oxford University Press (email available below). General contact details of provider: https://academic.oup.com/rev .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.