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Monitoring technology trends through patent analysis: a case study of thin film

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  • Sujit Bhattacharya
  • Moh'd Taiyab Rashid Khan

Abstract

The trends and directions of an important area, thin film technology, is explored through analysis of US patents, comparing activity in 1989, 1993 and 1997, and 1993–1997 in detail. A classification system for all the patents in our data set under technological sector(s) and subsector(s) helps determine the major application areas of thin film technology, and thence broader subunits. The commonality and specificity of these sub-units over the time periods are delineated. The profiles of companies active in this technology are examined, including major application areas, changes in their application profile over the time periods, their main operational areas, international rankings, etc. Detailed inspection of the profile in 1993–1997 shows what the future trend might be in this technology. Copyright , Beech Tree Publishing.

Suggested Citation

  • Sujit Bhattacharya & Moh'd Taiyab Rashid Khan, 2001. "Monitoring technology trends through patent analysis: a case study of thin film," Research Evaluation, Oxford University Press, vol. 10(1), pages 33-45, April.
    • Handle: RePEc:oup:rseval:v:10:y:2001:i:1:p:33-45
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    File URL: http://hdl.handle.net/10.3152/147154401781777187
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    Cited by:

    1. Momeni, Abdolreza & Rost, Katja, 2016. "Identification and monitoring of possible disruptive technologies by patent-development paths and topic modeling," Technological Forecasting and Social Change, Elsevier, vol. 104(C), pages 16-29.
    2. Sujit Bhattacharya & Martin Meyer, 2003. "Large firms and the science-technology interface Patents, patent citations, and scientific output of multinational corporations in thin films," Scientometrics, Springer;Akadémiai Kiadó, vol. 58(2), pages 265-279, October.
    3. Sujit Bhattacharya & Hildrun Kretschmer & Martin Meyer, 2003. "Characterizing intellectual spaces between science and technology," Scientometrics, Springer;Akadémiai Kiadó, vol. 58(2), pages 369-390, October.
    4. Martin Meyer & Sujit Bhattacharya, 2004. "Commonalities and differences between scholarly and technical collaboration," Scientometrics, Springer;Akadémiai Kiadó, vol. 61(3), pages 443-456, November.

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