Author
Listed:
- Yimeng Guo
(Institute of Metal Research, Chinese Academy of Sciences
University of Science and Technology of China)
- Jiangxu Li
(Institute of Metal Research, Chinese Academy of Sciences)
- Xuepeng Zhan
(Shandong University)
- Chunwen Wang
(University of Chinese Academy of Sciences)
- Min Li
(ShanghaiTech University
ShanghaiTech University)
- Biao Zhang
(Shenzhen Campus of Sun Yat-Sen University
Peking University)
- Zirui Wang
(Peking University)
- Yueyang Liu
(Chinese Academy of Sciences Beijing)
- Kaining Yang
(Shanxi University
Shanxi University)
- Hai Wang
(Shandong University)
- Wanying Li
(Institute of Metal Research, Chinese Academy of Sciences)
- Pingfan Gu
(Collaborative Innovation Center of Quantum Matter
Peking University)
- Zhaoping Luo
(Institute of Metal Research, Chinese Academy of Sciences)
- Yingjia Liu
(Institute of Metal Research, Chinese Academy of Sciences
University of Science and Technology of China)
- Peitao Liu
(Institute of Metal Research, Chinese Academy of Sciences)
- Bo Chen
(Shandong University)
- Kenji Watanabe
(National Institute for Materials Science)
- Takashi Taniguchi
(National Institute for Materials Science)
- Xing-Qiu Chen
(Institute of Metal Research, Chinese Academy of Sciences)
- Chengbing Qin
(Shanxi University
Shanxi University)
- Jiezhi Chen
(Shandong University)
- Dongming Sun
(Institute of Metal Research, Chinese Academy of Sciences)
- Jing Zhang
(Shanxi University
Shanxi University)
- Runsheng Wang
(Peking University)
- Jianpeng Liu
(ShanghaiTech University
ShanghaiTech University
Liaoning Academy of Materials)
- Yu Ye
(Collaborative Innovation Center of Quantum Matter
Peking University
Liaoning Academy of Materials)
- Xiuyan Li
(Institute of Metal Research, Chinese Academy of Sciences
Liaoning Academy of Materials)
- Yanglong Hou
(Shenzhen Campus of Sun Yat-Sen University
Peking University)
- Wu Zhou
(University of Chinese Academy of Sciences)
- Hanwen Wang
(Liaoning Academy of Materials)
- Zheng Han
(Shanxi University
Shanxi University
Liaoning Academy of Materials)
Abstract
Vertical three-dimensional integration of two-dimensional (2D) semiconductors holds great promise, as it offers the possibility to scale up logic layers in the z axis1–3. Indeed, vertical complementary field-effect transistors (CFETs) built with such mixed-dimensional heterostructures4,5, as well as hetero-2D layers with different carrier types6–8, have been demonstrated recently. However, so far, the lack of a controllable doping scheme (especially p-doped WSe2 (refs. 9–17) and MoS2 (refs. 11,18–28)) in 2D semiconductors, preferably in a stable and non-destructive manner, has greatly impeded the bottom-up scaling of complementary logic circuitries. Here we show that, by bringing transition metal dichalcogenides, such as MoS2, atop a van der Waals (vdW) antiferromagnetic insulator chromium oxychloride (CrOCl), the carrier polarity in MoS2 can be readily reconfigured from n- to p-type via strong vdW interfacial coupling. The consequential band alignment yields transistors with room-temperature hole mobilities up to approximately 425 cm2 V−1 s−1, on/off ratios reaching 106 and air-stable performance for over one year. Based on this approach, vertically constructed complementary logic, including inverters with 6 vdW layers, NANDs with 14 vdW layers and SRAMs with 14 vdW layers, are further demonstrated. Our findings of polarity-engineered p- and n-type 2D semiconductor channels with and without vdW intercalation are robust and universal to various materials and thus may throw light on future three-dimensional vertically integrated circuits based on 2D logic gates.
Suggested Citation
Yimeng Guo & Jiangxu Li & Xuepeng Zhan & Chunwen Wang & Min Li & Biao Zhang & Zirui Wang & Yueyang Liu & Kaining Yang & Hai Wang & Wanying Li & Pingfan Gu & Zhaoping Luo & Yingjia Liu & Peitao Liu & B, 2024.
"Van der Waals polarity-engineered 3D integration of 2D complementary logic,"
Nature, Nature, vol. 630(8016), pages 346-352, June.
Handle:
RePEc:nat:nature:v:630:y:2024:i:8016:d:10.1038_s41586-024-07438-5
DOI: 10.1038/s41586-024-07438-5
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