Author
Listed:
- Javier del Valle
(University of California–San Diego)
- Pavel Salev
(University of California–San Diego)
- Federico Tesler
(Universidad de Buenos Aires
Ciudad Universitaria)
- Nicolás M. Vargas
(University of California–San Diego)
- Yoav Kalcheim
(University of California–San Diego)
- Paul Wang
(University of California–San Diego)
- Juan Trastoy
(University of California–San Diego
Unité Mixte de Physique, CNRS, Thales, Université Paris-Sud, Université Paris-Saclay)
- Min-Han Lee
(University of California–San Diego)
- George Kassabian
(University of California–San Diego)
- Juan Gabriel Ramírez
(Universidad de los Andes)
- Marcelo J. Rozenberg
(CNRS, Université Paris-Sud, Université Paris-Saclay)
- Ivan K. Schuller
(University of California–San Diego)
Abstract
Resistive switching, a phenomenon in which the resistance of a device can be modified by applying an electric field1–5, is at the core of emerging technologies such as neuromorphic computing and resistive memories6–9. Among the different types of resistive switching, threshold firing10–14 is one of the most promising, as it may enable the implementation of artificial spiking neurons7,13,14. Threshold firing is observed in Mott insulators featuring an insulator-to-metal transition15,16, which can be triggered by applying an external voltage: the material becomes conducting (‘fires’) if a threshold voltage is exceeded7,10–12. The dynamics of this induced transition have been thoroughly studied, and its underlying mechanism and characteristic time are well documented10,12,17,18. By contrast, there is little knowledge regarding the opposite transition: the process by which the system returns to the insulating state after the voltage is removed. Here we show that Mott nanodevices retain a memory of previous resistive switching events long after the insulating resistance has recovered. We demonstrate that, although the device returns to its insulating state within 50 to 150 nanoseconds, it is possible to re-trigger the insulator-to-metal transition by using subthreshold voltages for a much longer time (up to several milliseconds). We find that the intrinsic metastability of first-order phase transitions is the origin of this phenomenon, and so it is potentially present in all Mott systems. This effect constitutes a new type of volatile memory in Mott-based devices, with potential applications in resistive memories, solid-state frequency discriminators and neuromorphic circuits.
Suggested Citation
Javier del Valle & Pavel Salev & Federico Tesler & Nicolás M. Vargas & Yoav Kalcheim & Paul Wang & Juan Trastoy & Min-Han Lee & George Kassabian & Juan Gabriel Ramírez & Marcelo J. Rozenberg & Ivan K., 2019.
"Subthreshold firing in Mott nanodevices,"
Nature, Nature, vol. 569(7756), pages 388-392, May.
Handle:
RePEc:nat:nature:v:569:y:2019:i:7756:d:10.1038_s41586-019-1159-6
DOI: 10.1038/s41586-019-1159-6
Download full text from publisher
As the access to this document is restricted, you may want to search for a different version of it.
Citations
Citations are extracted by the
CitEc Project, subscribe to its
RSS feed for this item.
Cited by:
- Fernandez, Leandro E. & Carpio, Agustin & Wu, Jiaming & Boccaletti, Stefano & Rozenberg, Marcelo & Mindlin, Gabriel B., 2024.
"A model for an electronic spiking neuron built with a memristive voltage-gated element,"
Chaos, Solitons & Fractals, Elsevier, vol. 180(C).
Corrections
All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:nat:nature:v:569:y:2019:i:7756:d:10.1038_s41586-019-1159-6. See general information about how to correct material in RePEc.
If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.
We have no bibliographic references for this item. You can help adding them by using this form .
If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.
For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Sonal Shukla or Springer Nature Abstracting and Indexing (email available below). General contact details of provider: http://www.nature.com .
Please note that corrections may take a couple of weeks to filter through
the various RePEc services.