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Stimulated X-ray emission for materials science

Author

Listed:
  • M. Beye

    (Institute for Methods and Instrumentation of Synchrotron Radiation Research G-ISRR, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany)

  • S. Schreck

    (Institute for Methods and Instrumentation of Synchrotron Radiation Research G-ISRR, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany
    Fakultät für Physik und Astronomie, Universität Potsdam, Karl-Liebknecht-Straße 24–25, 14476 Potsdam, Germany)

  • F. Sorgenfrei

    (Institute for Methods and Instrumentation of Synchrotron Radiation Research G-ISRR, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany
    Institut für Experimentalphysik, Universität Hamburg and Centre for Free-Electron Laser Science, Luruper Chaussee 149, 22761 Hamburg, Germany)

  • C. Trabant

    (Institute for Methods and Instrumentation of Synchrotron Radiation Research G-ISRR, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany
    Fakultät für Physik und Astronomie, Universität Potsdam, Karl-Liebknecht-Straße 24–25, 14476 Potsdam, Germany
    II. Physikalisches Institut, Universität zu Köln, Zülpicher Straße 77, 50937 Köln, Germany)

  • N. Pontius

    (Institute for Methods and Instrumentation of Synchrotron Radiation Research G-ISRR, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany)

  • C. Schüßler-Langeheine

    (Institute for Methods and Instrumentation of Synchrotron Radiation Research G-ISRR, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany)

  • W. Wurth

    (Institut für Experimentalphysik, Universität Hamburg and Centre for Free-Electron Laser Science, Luruper Chaussee 149, 22761 Hamburg, Germany)

  • A. Föhlisch

    (Institute for Methods and Instrumentation of Synchrotron Radiation Research G-ISRR, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany
    Fakultät für Physik und Astronomie, Universität Potsdam, Karl-Liebknecht-Straße 24–25, 14476 Potsdam, Germany)

Abstract

Resonant inelastic X-ray scattering requires very high photon densities to detect the relatively weak signals of interest, but here it is demonstrated that inducing stimulated X-ray emission from crystalline silicon can increase the signal level by several orders of magnitude and reduces sample damage.

Suggested Citation

  • M. Beye & S. Schreck & F. Sorgenfrei & C. Trabant & N. Pontius & C. Schüßler-Langeheine & W. Wurth & A. Föhlisch, 2013. "Stimulated X-ray emission for materials science," Nature, Nature, vol. 501(7466), pages 191-194, September.
    • Handle: RePEc:nat:nature:v:501:y:2013:i:7466:d:10.1038_nature12449
    DOI: 10.1038/nature12449
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    Cited by:

    1. Kenji Tamasaku & Munetaka Taguchi & Ichiro Inoue & Taito Osaka & Yuichi Inubushi & Makina Yabashi & Tetsuya Ishikawa, 2023. "Two-dimensional Kβ-Kα fluorescence spectrum by nonlinear resonant inelastic X-ray scattering," Nature Communications, Nature, vol. 14(1), pages 1-7, December.

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