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Virtual substrate method for nanomaterials characterization

Author

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  • Bo Da

    (International Center for Young Scientists, National Institute for Materials Science
    Surface Chemical Analysis Group, Nano Characterization Unit, National Institute for Materials Science
    Magnet Materials Group, Center for Materials Research by Information Integration, National Institute for Materials Science)

  • Jiangwei Liu

    (International Center for Young Scientists, National Institute for Materials Science)

  • Mahito Yamamoto

    (International Center for Materials Nanoarchitectonics, National Institute for Materials Science)

  • Yoshihiro Ueda

    (Tokyo University of Science)

  • Kazuyuki Watanabe

    (Tokyo University of Science)

  • Nguyen Thanh Cuong

    (International Center for Young Scientists, National Institute for Materials Science
    International Center for Materials Nanoarchitectonics, National Institute for Materials Science)

  • Songlin Li

    (International Center for Materials Nanoarchitectonics, National Institute for Materials Science)

  • Kazuhito Tsukagoshi

    (International Center for Materials Nanoarchitectonics, National Institute for Materials Science)

  • Hideki Yoshikawa

    (Surface Chemical Analysis Group, Nano Characterization Unit, National Institute for Materials Science)

  • Hideo Iwai

    (Surface Chemical Analysis Group, Nano Characterization Unit, National Institute for Materials Science)

  • Shigeo Tanuma

    (Surface Chemical Analysis Group, Nano Characterization Unit, National Institute for Materials Science)

  • Hongxuan Guo

    (Center for Nanoscale Science and Technology, National Institute of Standards and Technology)

  • Zhaoshun Gao

    (National Institute for Materials Science)

  • Xia Sun

    (University of Science and Technology of China)

  • Zejun Ding

    (University of Science and Technology of China)

Abstract

Characterization techniques available for bulk or thin-film solid-state materials have been extended to substrate-supported nanomaterials, but generally non-quantitatively. This is because the nanomaterial signals are inevitably buried in the signals from the underlying substrate in common reflection-configuration techniques. Here, we propose a virtual substrate method, inspired by the four-point probe technique for resistance measurement as well as the chop-nod method in infrared astronomy, to characterize nanomaterials without the influence of underlying substrate signals from four interrelated measurements. By implementing this method in secondary electron (SE) microscopy, a SE spectrum (white electrons) associated with the reflectivity difference between two different substrates can be tracked and controlled. The SE spectrum is used to quantitatively investigate the covering nanomaterial based on subtle changes in the transmission of the nanomaterial with high efficiency rivalling that of conventional core-level electrons. The virtual substrate method represents a benchmark for surface analysis to provide ‘free-standing’ information about supported nanomaterials.

Suggested Citation

  • Bo Da & Jiangwei Liu & Mahito Yamamoto & Yoshihiro Ueda & Kazuyuki Watanabe & Nguyen Thanh Cuong & Songlin Li & Kazuhito Tsukagoshi & Hideki Yoshikawa & Hideo Iwai & Shigeo Tanuma & Hongxuan Guo & Zha, 2017. "Virtual substrate method for nanomaterials characterization," Nature Communications, Nature, vol. 8(1), pages 1-9, August.
    • Handle: RePEc:nat:natcom:v:8:y:2017:i:1:d:10.1038_ncomms15629
    DOI: 10.1038/ncomms15629
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