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Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films

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Listed:
  • Peng Gao

    (Electron Microscopy Laboratory, School of Physics, Peking University
    Collaborative Innovation Centre of Quantum Matter
    Centre for Nanochemistry, College of Chemistry and Molecular Engineering, Peking University
    Academy for Advanced Interdisciplinary Studies, Peking University)

  • Zhangyuan Zhang

    (Electron Microscopy Laboratory, School of Physics, Peking University
    Wuhan University)

  • Mingqiang Li

    (Electron Microscopy Laboratory, School of Physics, Peking University
    Academy for Advanced Interdisciplinary Studies, Peking University)

  • Ryo Ishikawa

    (Institute of Engineering Innovation, The University of Tokyo)

  • Bin Feng

    (Institute of Engineering Innovation, The University of Tokyo)

  • Heng-Jui Liu

    (National Chung Hsing University)

  • Yen-Lin Huang

    (National Chiao Tung University)

  • Naoya Shibata

    (Institute of Engineering Innovation, The University of Tokyo)

  • Xiumei Ma

    (Electron Microscopy Laboratory, School of Physics, Peking University)

  • Shulin Chen

    (Electron Microscopy Laboratory, School of Physics, Peking University)

  • Jingmin Zhang

    (Electron Microscopy Laboratory, School of Physics, Peking University)

  • Kaihui Liu

    (Collaborative Innovation Centre of Quantum Matter
    Centre for Nanochemistry, College of Chemistry and Molecular Engineering, Peking University
    Academy for Advanced Interdisciplinary Studies, Peking University)

  • En-Ge Wang

    (Collaborative Innovation Centre of Quantum Matter
    International Centre for Quantum Materials, School of Physics, Peking University)

  • Dapeng Yu

    (Electron Microscopy Laboratory, School of Physics, Peking University
    Collaborative Innovation Centre of Quantum Matter
    South University of Science and Technology of China)

  • Lei Liao

    (Wuhan University)

  • Ying-Hao Chu

    (National Chiao Tung University
    Institute of Physics, Academia Sinica)

  • Yuichi Ikuhara

    (Institute of Engineering Innovation, The University of Tokyo
    Nanostructures Research Laboratory, Japan Fine Ceramic Centre
    WPI Advanced Institute for Materials Research, Tohoku University)

Abstract

Although the size effect in ferroelectric thin films has been known for long time, the underlying mechanism is not yet fully understood and whether or not there is a critical thickness below which the ferroelectricity vanishes is still under debate. Here, we directly measure the thickness-dependent polarization in ultrathin PbZr0.2Ti0.8O3 films via quantitative annular bright field imaging. We find that the polarization is significantly suppressed for films

Suggested Citation

  • Peng Gao & Zhangyuan Zhang & Mingqiang Li & Ryo Ishikawa & Bin Feng & Heng-Jui Liu & Yen-Lin Huang & Naoya Shibata & Xiumei Ma & Shulin Chen & Jingmin Zhang & Kaihui Liu & En-Ge Wang & Dapeng Yu & Lei, 2017. "Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films," Nature Communications, Nature, vol. 8(1), pages 1-8, August.
    • Handle: RePEc:nat:natcom:v:8:y:2017:i:1:d:10.1038_ncomms15549
    DOI: 10.1038/ncomms15549
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    Cited by:

    1. Luying Song & Ying Zhao & Bingqian Xu & Ruofan Du & Hui Li & Wang Feng & Junbo Yang & Xiaohui Li & Zijia Liu & Xia Wen & Yanan Peng & Yuzhu Wang & Hang Sun & Ling Huang & Yulin Jiang & Yao Cai & Xue J, 2024. "Robust multiferroic in interfacial modulation synthesized wafer-scale one-unit-cell of chromium sulfide," Nature Communications, Nature, vol. 15(1), pages 1-11, December.

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