Author
Listed:
- Anna Giorgioni
(Università di Milano Bicocca)
- Stefano Paleari
(Università di Milano Bicocca)
- Stefano Cecchi
(Politecnico di Milano
Present address: Paul-Drude-Institut für Festkörperelektronik, Hausvogteiplatz 5–7, 10117 Berlin, Germany)
- Elisa Vitiello
(Università di Milano Bicocca)
- Emanuele Grilli
(Università di Milano Bicocca)
- Giovanni Isella
(Politecnico di Milano)
- Wolfgang Jantsch
(Institut für Halbleiter-und Festkörperphysik, Johannes Kepler University)
- Marco Fanciulli
(Università di Milano Bicocca)
- Fabio Pezzoli
(Università di Milano Bicocca)
Abstract
Control of electron spin coherence via external fields is fundamental in spintronics. Its implementation demands a host material that accommodates the desirable but contrasting requirements of spin robustness against relaxation mechanisms and sizeable coupling between spin and orbital motion of the carriers. Here, we focus on Ge, which is a prominent candidate for shuttling spin quantum bits into the mainstream Si electronics. So far, however, the intrinsic spin-dependent phenomena of free electrons in conventional Ge/Si heterojunctions have proved to be elusive because of epitaxy constraints and an unfavourable band alignment. We overcome these fundamental limitations by investigating a two-dimensional electron gas in quantum wells of pure Ge grown on Si. These epitaxial systems demonstrate exceptionally long spin lifetimes. In particular, by fine-tuning quantum confinement we demonstrate that the electron Landé g factor can be engineered in our CMOS-compatible architecture over a range previously inaccessible for Si spintronics.
Suggested Citation
Anna Giorgioni & Stefano Paleari & Stefano Cecchi & Elisa Vitiello & Emanuele Grilli & Giovanni Isella & Wolfgang Jantsch & Marco Fanciulli & Fabio Pezzoli, 2016.
"Strong confinement-induced engineering of the g factor and lifetime of conduction electron spins in Ge quantum wells,"
Nature Communications, Nature, vol. 7(1), pages 1-11, December.
Handle:
RePEc:nat:natcom:v:7:y:2016:i:1:d:10.1038_ncomms13886
DOI: 10.1038/ncomms13886
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