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High-performance n-type black phosphorus transistors with type control via thickness and contact-metal engineering

Author

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  • David J. Perello

    (IBS Center for Integrated Nanostructure Physics, Institute for Basic Science, Sungkyunkwan University)

  • Sang Hoon Chae

    (IBS Center for Integrated Nanostructure Physics, Institute for Basic Science, Sungkyunkwan University)

  • Seunghyun Song

    (IBS Center for Integrated Nanostructure Physics, Institute for Basic Science, Sungkyunkwan University)

  • Young Hee Lee

    (IBS Center for Integrated Nanostructure Physics, Institute for Basic Science, Sungkyunkwan University
    Sungkyunkwan University
    Sungkyunkwan University)

Abstract

Recent work has demonstrated excellent p-type field-effect switching in exfoliated black phosphorus, but type control has remained elusive. Here, we report unipolar n-type black phosphorus transistors with switching polarity control via contact-metal engineering and flake thickness, combined with oxygen and moisture-free fabrication. With aluminium contacts to black phosphorus, a unipolar to ambipolar transition occurs as flake thickness increases from 3 to 13 nm. The 13-nm aluminium-contacted flake displays graphene-like symmetric hole and electron mobilities up to 950 cm2 V−1 s−1 at 300 K, while a 3 nm flake displays unipolar n-type switching with on/off ratios greater than 105 (107) and electron mobility of 275 (630) cm2 V−1 s−1 at 300 K (80 K). For palladium contacts, p-type behaviour dominates in thick flakes, while 2.5–7 nm flakes have symmetric ambipolar transport. These results demonstrate a leap in n-type performance and exemplify the logical switching capabilities of black phosphorus.

Suggested Citation

  • David J. Perello & Sang Hoon Chae & Seunghyun Song & Young Hee Lee, 2015. "High-performance n-type black phosphorus transistors with type control via thickness and contact-metal engineering," Nature Communications, Nature, vol. 6(1), pages 1-10, November.
  • Handle: RePEc:nat:natcom:v:6:y:2015:i:1:d:10.1038_ncomms8809
    DOI: 10.1038/ncomms8809
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