Author
Listed:
- Harry Chou
(The University of Texas at Austin
Microelectronics Research Center, The University of Texas at Austin)
- Ariel Ismach
(The University of Texas at Austin
Tel Aviv University)
- Rudresh Ghosh
(Microelectronics Research Center, The University of Texas at Austin)
- Rodney S. Ruoff
(The University of Texas at Austin
Center for Multidimensional Carbon Materials, Institute of Basic Sciences Center, Ulsan National Institute of Science and Technology)
- Andrei Dolocan
(Texas Materials Institute, The University of Texas at Austin)
Abstract
Two-dimensional (2D) atomic crystals and their heterostructures are an intense area of study owing to their unique properties that result from structural planar confinement. Intrinsically, the performance of a planar vertical device is linked to the quality of its 2D components and their interfaces, therefore requiring characterization tools that can reveal both its planar chemistry and morphology. Here, we propose a characterization methodology combining (micro-) Raman spectroscopy, atomic force microscopy and time-of-flight secondary ion mass spectrometry to provide structural information, morphology and planar chemical composition at virtually the atomic level, aimed specifically at studying 2D vertical heterostructures. As an example system, a graphene-on-h-BN heterostructure is analysed to reveal, with an unprecedented level of detail, the subtle chemistry and interactions within its layer structure that can be assigned to specific fabrication steps. Such detailed chemical information is of crucial importance for the complete integration of 2D heterostructures into functional devices.
Suggested Citation
Harry Chou & Ariel Ismach & Rudresh Ghosh & Rodney S. Ruoff & Andrei Dolocan, 2015.
"Revealing the planar chemistry of two-dimensional heterostructures at the atomic level,"
Nature Communications, Nature, vol. 6(1), pages 1-8, November.
Handle:
RePEc:nat:natcom:v:6:y:2015:i:1:d:10.1038_ncomms8482
DOI: 10.1038/ncomms8482
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