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Surface determination through atomically resolved secondary-electron imaging

Author

Listed:
  • J. Ciston

    (National Center for Electron Microscopy, The Molecular Foundry, Lawrence Berkeley National Laboratory)

  • H. G. Brown

    (School of Physics, University of Melbourne)

  • A. J. D’Alfonso

    (School of Physics, University of Melbourne)

  • P. Koirala

    (Northwestern University)

  • C. Ophus

    (National Center for Electron Microscopy, The Molecular Foundry, Lawrence Berkeley National Laboratory)

  • Y. Lin

    (Northwestern University)

  • Y. Suzuki

    (Hitachi High Technologies Corp.)

  • H. Inada

    (Hitachi High Technologies Corp.)

  • Y. Zhu

    (Condensed Matter Physics and Materials Science, Brookhaven National Laboratory)

  • L. J. Allen

    (School of Physics, University of Melbourne)

  • L. D. Marks

    (Northwestern University)

Abstract

Unique determination of the atomic structure of technologically relevant surfaces is often limited by both a need for homogeneous crystals and ambiguity of registration between the surface and bulk. Atomically resolved secondary-electron imaging is extremely sensitive to this registration and is compatible with faceted nanomaterials, but has not been previously utilized for surface structure determination. Here we report a detailed experimental atomic-resolution secondary-electron microscopy analysis of the c(6 × 2) reconstruction on strontium titanate (001) coupled with careful simulation of secondary-electron images, density functional theory calculations and surface monolayer-sensitive aberration-corrected plan-view high-resolution transmission electron microscopy. Our work reveals several unexpected findings, including an amended registry of the surface on the bulk and strontium atoms with unusual seven-fold coordination within a typically high surface coverage of square pyramidal TiO5 units. Dielectric screening is found to play a critical role in attenuating secondary-electron generation processes from valence orbitals.

Suggested Citation

  • J. Ciston & H. G. Brown & A. J. D’Alfonso & P. Koirala & C. Ophus & Y. Lin & Y. Suzuki & H. Inada & Y. Zhu & L. J. Allen & L. D. Marks, 2015. "Surface determination through atomically resolved secondary-electron imaging," Nature Communications, Nature, vol. 6(1), pages 1-8, November.
  • Handle: RePEc:nat:natcom:v:6:y:2015:i:1:d:10.1038_ncomms8358
    DOI: 10.1038/ncomms8358
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