Author
Listed:
- Robert C. Masters
(University of Sheffield)
- Andrew J. Pearson
(University of Cambridge, Cavendish Laboratory)
- Tom S. Glen
(University of Cambridge, Cavendish Laboratory)
- Fabian-Cyril Sasam
(FEI Co. Europe NanoPort)
- Letian Li
(FEI Co. Europe NanoPort)
- Maurizio Dapor
(European Centre for Theoretical Studies in Nuclear Physics and Related Areas (ECT*-FBK) and Trento Institute for Fundamental Physics and Applications (TIFPA-INFN))
- Athene M. Donald
(University of Cambridge, Cavendish Laboratory)
- David G. Lidzey
(University of Sheffield)
- Cornelia Rodenburg
(University of Sheffield)
Abstract
The resolution capability of the scanning electron microscope has increased immensely in recent years, and is now within the sub-nanometre range, at least for inorganic materials. An equivalent advance has not yet been achieved for imaging the morphologies of nanostructured organic materials, such as organic photovoltaic blends. Here we show that energy-selective secondary electron detection can be used to obtain high-contrast, material-specific images of an organic photovoltaic blend. We also find that we can differentiate mixed phases from pure material phases in our data. The lateral resolution demonstrated is twice that previously reported from secondary electron imaging. Our results suggest that our energy-filtered scanning electron microscopy approach will be able to make major inroads into the understanding of complex, nano-structured organic materials.
Suggested Citation
Robert C. Masters & Andrew J. Pearson & Tom S. Glen & Fabian-Cyril Sasam & Letian Li & Maurizio Dapor & Athene M. Donald & David G. Lidzey & Cornelia Rodenburg, 2015.
"Sub-nanometre resolution imaging of polymer–fullerene photovoltaic blends using energy-filtered scanning electron microscopy,"
Nature Communications, Nature, vol. 6(1), pages 1-9, November.
Handle:
RePEc:nat:natcom:v:6:y:2015:i:1:d:10.1038_ncomms7928
DOI: 10.1038/ncomms7928
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