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Perfect anomalous refraction metasurfaces empowered half-space optical beam scanning

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  • Tao He

    (Tongji University
    MOE Key Laboratory of Advanced Micro-Structured Materials
    Shanghai Frontiers Science Center of Digital Optics
    Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications)

  • Dongdong Li

    (Tongji University
    MOE Key Laboratory of Advanced Micro-Structured Materials
    Shanghai Frontiers Science Center of Digital Optics
    Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications)

  • Chengfeng Li

    (Tongji University
    MOE Key Laboratory of Advanced Micro-Structured Materials
    Shanghai Frontiers Science Center of Digital Optics
    Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications)

  • Haigang Liang

    (Tongji University
    MOE Key Laboratory of Advanced Micro-Structured Materials
    Shanghai Frontiers Science Center of Digital Optics
    Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications)

  • Chao Feng

    (Tongji University
    MOE Key Laboratory of Advanced Micro-Structured Materials
    Shanghai Frontiers Science Center of Digital Optics
    Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications)

  • Jingyuan Zhu

    (Tongji University
    MOE Key Laboratory of Advanced Micro-Structured Materials
    Shanghai Frontiers Science Center of Digital Optics
    Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications)

  • Lingyun Xie

    (Tongji University
    MOE Key Laboratory of Advanced Micro-Structured Materials
    Shanghai Frontiers Science Center of Digital Optics
    Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications)

  • Siyu Dong

    (Tongji University
    MOE Key Laboratory of Advanced Micro-Structured Materials
    Shanghai Frontiers Science Center of Digital Optics
    Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications)

  • Yuzhi Shi

    (Tongji University
    MOE Key Laboratory of Advanced Micro-Structured Materials
    Shanghai Frontiers Science Center of Digital Optics
    Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications)

  • Xiong Dun

    (Tongji University
    MOE Key Laboratory of Advanced Micro-Structured Materials
    Shanghai Frontiers Science Center of Digital Optics
    Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications)

  • Zeyong Wei

    (Tongji University
    MOE Key Laboratory of Advanced Micro-Structured Materials
    Shanghai Frontiers Science Center of Digital Optics
    Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications)

  • Zhanshan Wang

    (Tongji University
    MOE Key Laboratory of Advanced Micro-Structured Materials
    Shanghai Frontiers Science Center of Digital Optics
    Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications)

  • Xinbin Cheng

    (Tongji University
    MOE Key Laboratory of Advanced Micro-Structured Materials
    Shanghai Frontiers Science Center of Digital Optics
    Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications)

Abstract

Metasurface-based optical beam scanning devices are gaining attention in optics and photonics for their potential to revolutionize light detection and ranging systems. However, achieving anomalous refraction with perfect efficiency (>99%) remains challenging, limiting the efficiency and field of view (FOV) of metasurface-based optical beam scanning devices. Here, we introduce a paradigm for achieving perfect anomalous refraction by augmenting longitudinal degrees of freedom arousing a multiple scattering process to optimize symmetry breaking. An all-dielectric quasi-three-dimensional subwavelength structure (Q3D-SWS), composed of a purposely designed multilayer film and a dielectric metasurface separated by a spacer, is proposed to eliminate reflection loss and spurious diffraction, achieving >99% anomalous refraction efficiency. By independently rotating two cascaded Q3D-SWSs, we experimentally showcase half-space optical beam scanning, achieving a FOV of 144° × 144°, with a maximum efficiency exceeding 86%. Our results open new avenues for high-efficiency metasurfaces and advances applications in light detection and ranging systems.

Suggested Citation

  • Tao He & Dongdong Li & Chengfeng Li & Haigang Liang & Chao Feng & Jingyuan Zhu & Lingyun Xie & Siyu Dong & Yuzhi Shi & Xiong Dun & Zeyong Wei & Zhanshan Wang & Xinbin Cheng, 2025. "Perfect anomalous refraction metasurfaces empowered half-space optical beam scanning," Nature Communications, Nature, vol. 16(1), pages 1-8, December.
  • Handle: RePEc:nat:natcom:v:16:y:2025:i:1:d:10.1038_s41467-025-58502-1
    DOI: 10.1038/s41467-025-58502-1
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