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Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations

Author

Listed:
  • Sven Gustafson

    (Purdue University)

  • Wolfgang Ludwig

    (University Lyon I
    European Synchrotron Radiation Facility)

  • Paul Shade

    (Air Force Research Laboratory)

  • Diwakar Naragani

    (Purdue University)

  • Darren Pagan

    (Cornell High Energy Synchrotron Source)

  • Phil Cook

    (European Synchrotron Radiation Facility)

  • Can Yildirim

    (European Synchrotron Radiation Facility
    LETI, CEA, 17 Avenue des Martyrs)

  • Carsten Detlefs

    (European Synchrotron Radiation Facility)

  • Michael D. Sangid

    (Purdue University)

Abstract

During cyclic loading, localization of intragranular deformation due to crystallographic slip acts as a precursor for crack initiation, often at coherent twin boundaries. A suite of high-resolution synchrotron X-ray characterizations, coupled with a crystal plasticity simulation, was conducted on a polycrystalline nickel-based superalloy microstructure near a parent-twin boundary in order to understand the deformation localization behavior of this critical, 3D microstructural configuration. Dark-field X-ray microscopy was spatially linked to high energy X-ray diffraction microscopy and X-ray diffraction contrast tomography in order to quantify, with cutting-edge resolution, an intragranular misorientation and high elastic strain gradients near a twin boundary. These observations quantify the extreme sub-grain scale stress gradients present in polycrystalline microstructures, which often lead to fatigue failure.

Suggested Citation

  • Sven Gustafson & Wolfgang Ludwig & Paul Shade & Diwakar Naragani & Darren Pagan & Phil Cook & Can Yildirim & Carsten Detlefs & Michael D. Sangid, 2020. "Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations," Nature Communications, Nature, vol. 11(1), pages 1-10, December.
    • Handle: RePEc:nat:natcom:v:11:y:2020:i:1:d:10.1038_s41467-020-16894-2
    DOI: 10.1038/s41467-020-16894-2
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