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Heteroepitaxial passivation of Cs2AgBiBr6 wafers with suppressed ionic migration for X-ray imaging

Author

Listed:
  • Bo Yang

    (Huazhong University of Science and Technology (HUST)
    Huazhong University of Science and Technology (HUST))

  • Weicheng Pan

    (Huazhong University of Science and Technology (HUST)
    Huazhong University of Science and Technology (HUST))

  • Haodi Wu

    (Huazhong University of Science and Technology (HUST)
    Huazhong University of Science and Technology (HUST))

  • Guangda Niu

    (Huazhong University of Science and Technology (HUST)
    Huazhong University of Science and Technology (HUST))

  • Jun-Hui Yuan

    (Huazhong University of Science and Technology (HUST))

  • Kan-Hao Xue

    (Huazhong University of Science and Technology (HUST))

  • Lixiao Yin

    (Huazhong University of Science and Technology (HUST)
    Huazhong University of Science and Technology (HUST))

  • Xinyuan Du

    (Huazhong University of Science and Technology (HUST)
    Huazhong University of Science and Technology (HUST))

  • Xiang-Shui Miao

    (Huazhong University of Science and Technology (HUST)
    Huazhong University of Science and Technology (HUST))

  • Xiaoquan Yang

    (Huazhong University of Science and Technology (HUST))

  • Qingguo Xie

    (Huazhong University of Science and Technology (HUST))

  • Jiang Tang

    (Huazhong University of Science and Technology (HUST)
    Huazhong University of Science and Technology (HUST))

Abstract

X-ray detectors are broadly utilized in medical imaging and product inspection. Halide perovskites recently demonstrate excellent performance for direct X-ray detection. However, ionic migration causes large noise and baseline drift, limiting the detection and imaging performance. Here we largely eliminate the ionic migration in cesium silver bismuth bromide (Cs2AgBiBr6) polycrystalline wafers by introducing bismuth oxybromide (BiOBr) as heteroepitaxial passivation layers. Good lattice match between BiOBr and Cs2AgBiBr6 enables complete defect passivation and suppressed ionic migration. The detector hence achieves outstanding balanced performance with a signal drifting one order of magnitude lower than all previous studies, low noise (1/f noise free), a high sensitivity of 250 µC Gy air−1 cm–2, and a spatial resolution of 4.9 lp mm−1. The wafer area could be easily scaled up by the isostatic-pressing method, together with the heteroepitaxial passivation, strengthens the competitiveness of Cs2AgBiBr6-based X-ray detectors as next-generation X-ray imaging flat panels.

Suggested Citation

  • Bo Yang & Weicheng Pan & Haodi Wu & Guangda Niu & Jun-Hui Yuan & Kan-Hao Xue & Lixiao Yin & Xinyuan Du & Xiang-Shui Miao & Xiaoquan Yang & Qingguo Xie & Jiang Tang, 2019. "Heteroepitaxial passivation of Cs2AgBiBr6 wafers with suppressed ionic migration for X-ray imaging," Nature Communications, Nature, vol. 10(1), pages 1-10, December.
    • Handle: RePEc:nat:natcom:v:10:y:2019:i:1:d:10.1038_s41467-019-09968-3
    DOI: 10.1038/s41467-019-09968-3
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    Cited by:

    1. Luyao Zheng & Amin Nozariasbmarz & Yuchen Hou & Jungjin Yoon & Wenjie Li & Yu Zhang & Haodong Wu & Dong Yang & Tao Ye & Mohan Sanghadasa & Ke Wang & Bed Poudel & Shashank Priya & Kai Wang, 2022. "A universal all-solid synthesis for high throughput production of halide perovskite," Nature Communications, Nature, vol. 13(1), pages 1-13, December.

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