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A General Framework for Learning Curve Reliability Growth Models

Author

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  • William S. Jewell

    (University of California, Berkeley, California)

Abstract

In reliability growth models, system performance improves during prototype testing, as design changes are made and operating procedures and the environment are modified. There is great interest in predicting the ultimate performance of the system, using only the epochs of the failures that occur early in the testing program. This paper constructs a general framework for learning-curve models of reliability growth, including many different model variations that have previously been analyzed. Numerical trials indicate the difficulty of estimating ultimate performance; the maximum likelihood estimator is unstable for small testing intervals with a small number of systems on test. Bayesian procedures are recommended for implementation.

Suggested Citation

  • William S. Jewell, 1984. "A General Framework for Learning Curve Reliability Growth Models," Operations Research, INFORMS, vol. 32(3), pages 547-558, June.
    • Handle: RePEc:inm:oropre:v:32:y:1984:i:3:p:547-558
    DOI: 10.1287/opre.32.3.547
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    Cited by:

    1. John Quigley & Lesley Walls, 2003. "Cost–benefit modelling for reliability growth," Journal of the Operational Research Society, Palgrave Macmillan;The OR Society, vol. 54(12), pages 1234-1241, December.
    2. Quigley, John & Walls, Lesley, 2011. "Mixing Bayes and empirical Bayes inference to anticipate the realization of engineering concerns about variant system designs," Reliability Engineering and System Safety, Elsevier, vol. 96(8), pages 933-941.

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