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Fabrication of FePt/M (M = C, Ag, Si) nanoparticulate thin films with perpendicular anisotropy

Author

Listed:
  • Yunhe Huang
  • Jun Wan
  • Yong Zhang
  • George Hadjipanayis

Abstract

FePt-based nanoparticulate thin films have been deposited by sputtering onto single crystal MgO [100] substrates at elevated temperatures up to 650°C. The deposited FePt film showed a [001] texture due to lattice matching between FePt and MgO substrate. The effects of an additional element on the magnetic and structural properties have been studied; addition of Ag leads to a lower transformation temperature from the disordered fcc to the ordered L10 phase. Si addition leads to a ternary FePtSi system where Si atoms enter into the FePt lattice interstitially, resulting in changes of lattice parameters and magnetic properties.

Suggested Citation

  • Yunhe Huang & Jun Wan & Yong Zhang & George Hadjipanayis, 2008. "Fabrication of FePt/M (M = C, Ag, Si) nanoparticulate thin films with perpendicular anisotropy," International Journal of Product Development, Inderscience Enterprises Ltd, vol. 5(3/4), pages 259-267.
    • Handle: RePEc:ids:ijpdev:v:5:y:2008:i:3/4:p:259-267
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