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The effectiveness study of Double Sampling s charts application on destructive testing process

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Listed:
  • Pei-Hsi Lee
  • Chau-Chen Torng
  • Jhih-Cyuan Wu
  • Chun-Chieh Tseng

Abstract

In semiconductor processes, many data of process were obtained by the destructive testing methods, which will incur high inspection cost. Double Sampling (DS) s charts can quickly detect the shifts of process standard deviation and effectively reduce sample size. In this study, DS s charts were designed based on a statistical viewpoint, and their performance was evaluated in comparison with Shewhart s charts. A real case of wire bonding process of IC packaging was used to demonstrate the effectiveness of proposed DS s charts in reducing the sample size of destructive testing.

Suggested Citation

  • Pei-Hsi Lee & Chau-Chen Torng & Jhih-Cyuan Wu & Chun-Chieh Tseng, 2010. "The effectiveness study of Double Sampling s charts application on destructive testing process," International Journal of Product Development, Inderscience Enterprises Ltd, vol. 12(3/4), pages 324-335.
    • Handle: RePEc:ids:ijpdev:v:12:y:2010:i:3/4:p:324-335
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    Cited by:

    1. Lee, Pei-Hsi, 2013. "Joint statistical design of X¯ and s charts with combined double sampling and variable sampling interval," European Journal of Operational Research, Elsevier, vol. 225(2), pages 285-297.
    2. Khoo, Michael B.C. & Teoh, W.L. & Castagliola, Philippe & Lee, M.H., 2013. "Optimal designs of the double sampling X¯ chart with estimated parameters," International Journal of Production Economics, Elsevier, vol. 144(1), pages 345-357.

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