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Analysing inspection frequency for wafer bumping process and an empirical study of UNISON decision framework

Author

Listed:
  • Chen-Fu Chien
  • Chih-Han Hu
  • Chi-Yung Lin

Abstract

This study aims to develop a UNISON decision framework for analysing the inspection frequency decisions for the advanced wafer bumping process. Since the accumulated values of the wafers fabricated in wafer fabs are high, process excursion and defects in bumping will cause serious loss. Thus, it is critical to determine the inspection frequency to fulfil the requirement of mass production while ensuring the yield. For validation, an empirical study was conducted in a bumping company and the results showed practical viability of the proposed approach.

Suggested Citation

  • Chen-Fu Chien & Chih-Han Hu & Chi-Yung Lin, 2008. "Analysing inspection frequency for wafer bumping process and an empirical study of UNISON decision framework," International Journal of Manufacturing Technology and Management, Inderscience Enterprises Ltd, vol. 14(1/2), pages 130-144.
  • Handle: RePEc:ids:ijmtma:v:14:y:2008:i:1/2:p:130-144
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