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N-policy for redundant repairable system with multiple types of warm standbys with switching failure and vacation

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  • Madhu Jain
  • Ritu Gupta

Abstract

This investigation is concerned with the reliability analysis of redundant repairable system which is supported by mixed standby and two repairmen who turn on according to a threshold N-policy. The first repairman never takes a vacation while the second repairman leaves for a vacation of random length when the number of failed components is less than N. The concepts of standby switching failure, degradation and common cause failure are incorporated to predict the performance metrics of the real time redundant repairable system. By developing Markov model, the transient queue size distribution and expressions for the system reliability, mean time to system failure and other performance measures are obtained. The sensitivity analysis is performed by taking numerical illustration. The model is also examined computationally by employing the adaptive network-based fuzzy interference system (ANFIS) approach to compute the system descriptors. Using supervised learning process, the comparison between the ANFIS results and analytical results are made.

Suggested Citation

  • Madhu Jain & Ritu Gupta, 2018. "N-policy for redundant repairable system with multiple types of warm standbys with switching failure and vacation," International Journal of Mathematics in Operational Research, Inderscience Enterprises Ltd, vol. 13(4), pages 419-449.
    • Handle: RePEc:ids:ijmore:v:13:y:2018:i:4:p:419-449
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    Cited by:

    1. Kumar, Pankaj & Jain, Madhu, 2020. "Reliability analysis of a multi-component machining system with service interruption, imperfect coverage, and reboot," Reliability Engineering and System Safety, Elsevier, vol. 202(C).
    2. Sudeep Kumar & Ritu Gupta, 2023. "Reliability analysis of N-policy vacation based FTC system subject to standby switching failures," Operations Research and Decisions, Wroclaw University of Science and Technology, Faculty of Management, vol. 33(2), pages 53-80.

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