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Variable sample size control chart for monitoring process capability index C pm

Author

Listed:
  • Dja Shin Wang
  • Hau Yu Yang
  • Tong Yuan Koo

Abstract

Process capability indices (PCIs) provide numerical measures of process reproduction capability and are effective tools for quality assurance. In the present paper, we develop a variable sample size control chart, namely VSSCpm, to monitor PCIs for industry manufacturing to improve product quality. We setup the control limits; determine the upper and lower warning limits, fixed sample size, central region sample size, and warning region sample size for the control chart; and apply them to monitor PCI Cpm. We also use the average run length (ARL) as a monitoring performance indicator. To increase the in-plant applicability of the proposed method, we tabulate the performance value of the ARL for various commonly used situations. We perform a sensitivity analysis to study the effects of model parameters on the monitoring performance and then present an example to illustrate the proposed procedure.

Suggested Citation

  • Dja Shin Wang & Hau Yu Yang & Tong Yuan Koo, 2020. "Variable sample size control chart for monitoring process capability index C pm," International Journal of Industrial and Systems Engineering, Inderscience Enterprises Ltd, vol. 36(1), pages 32-48.
    • Handle: RePEc:ids:ijisen:v:36:y:2020:i:1:p:32-48
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