Investigation of The Dielectric Properties Of (Cu, Tl) 1234 Added with Graphene

Superconducting samples of type (Cu­0.5Tl0.5)-1234 were prepared at normal pressure via one step of conventional solid state reaction technique, and added with x wt.% of graphene (0≤x≤0.1). X-ray powder diffraction (XRD) shows that the addition of graphene does not alter the tetragonal structure and the lattice parameters of the samples. Fourier Transform Infrared (FTIR) measurements indicate the non-uniform distribution of graphene inside the (Cu­0.5Tl0.5)-1234 phase. While the Scanning Electron Microscope (SEM) images reveal the increase of the inter-grain connectivity. The superconducting transition temperature Tc, obtained from Ac magnetic susceptibility measurements, shows an enhancement up to x=0.04 Wt. %, followed by a deterioration for x >0.04. The frequency dependence of the dielectric properties of the samples was experimentally investigated at different temperatures (110 K ≤ T ≤ 260 K). The real and imaginary parts (ε' and ε'') of dielectric constant increase up to x=0.1. The study of ε' and ε'', the dielectric loss (tan δ) and the ac-conductivity (σac) have shown that the variation of frequency, temperature and addition of graphene allows the tuning of these parameters for various applications.