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Bipolar Log-Intensity-Variance Histogram Method for Local Image Patch Intensity Change Measurements

Author

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  • Han Wang
  • Quan Shi
  • Zhihuo Xu
  • Ming Wei
  • Hanseok Ko

Abstract

For a fixed-position camera, the intensity changes of an image pixel are often caused by object movement or illumination change. This paper focuses on such a problem: given two adjacent local image patches, how can the causes of intensity change be determined? A bipolar log-intensity-variance histogram is proposed to describe the intensity variations on the chaos phase plot subspace. This is combined with two sigmoid functions to construct a probabilistic measure function. Experimental results show that the proposed measurements are more effective and robust than conventional methods to the cause of variation in image intensity.

Suggested Citation

  • Han Wang & Quan Shi & Zhihuo Xu & Ming Wei & Hanseok Ko, 2019. "Bipolar Log-Intensity-Variance Histogram Method for Local Image Patch Intensity Change Measurements," Mathematical Problems in Engineering, Hindawi, vol. 2019, pages 1-16, June.
    • Handle: RePEc:hin:jnlmpe:3651529
    DOI: 10.1155/2019/3651529
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