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Towards Automatic Image Exposure Level Assessment

Author

Listed:
  • Lin Zhang
  • Xilin Yang
  • Lijun Zhang
  • Xiao Liu
  • Shengjie Zhao
  • Yong Ma

Abstract

The quality of acquired images can be surely reduced by improper exposures. Thus, in many vision-related industries, such as imaging sensor manufacturing and video surveillance, an approach that can routinely and accurately evaluate exposure levels of images is in urgent need. Taking an image as input, such a method is expected to output a scalar value, which can represent the overall perceptual exposure level of the examined image, ranging from extremely underexposed to extremely overexposed. However, studies focusing on image exposure level assessment (IELA) are quite sporadic. It should be noted that blind NR-IQA (no-reference image quality assessment) algorithms or metrics used to measure the quality of contrast-distorted images cannot be used for IELA. The root reason is that though these algorithms can quantify quality distortion of images, they do not know whether the distortion is due to underexposure or overexposure. This paper aims to resolve the issue of IELA to some extent and contributes to two aspects. Firstly, an Image Exposure Database (IE ps D) is constructed to facilitate the study of IELA. IE ps D comprises 24,500 images with various exposure levels, and for each image a subjective exposure score is provided, which represents its perceptual exposure level. Secondly, as IELA can be naturally formulated as a regression problem, we thoroughly evaluate the performance of modern deep CNN architectures for solving this specific task. Our evaluation results can serve as a baseline when the other researchers develop even more sophisticated IELA approaches. To facilitate the other researchers to reproduce our results, we have released the dataset and the relevant source code at https://cslinzhang.github.io/imgExpo/.

Suggested Citation

  • Lin Zhang & Xilin Yang & Lijun Zhang & Xiao Liu & Shengjie Zhao & Yong Ma, 2020. "Towards Automatic Image Exposure Level Assessment," Mathematical Problems in Engineering, Hindawi, vol. 2020, pages 1-14, November.
  • Handle: RePEc:hin:jnlmpe:2789854
    DOI: 10.1155/2020/2789854
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