IDEAS home Printed from https://ideas.repec.org/a/gam/jmathe/v12y2024i18p2916-d1481312.html
   My bibliography  Save this article

Reliability Modeling of Systems with Undetected Degradation Considering Time Delays, Self-Repair, and Random Operating Environments

Author

Listed:
  • Hoang Pham

    (Department of Industrial and Systems Engineering, Rutgers University, Piscataway, NJ 08854, USA)

Abstract

In some settings, systems may not fail completely but instead undergo performance degradation, leading to reduced efficiency. A significant concern arises when a system transitions into a degraded state without immediate detection, with the degradation only becoming apparent after an unpredictable period. Undetected degradation can result in failures with significant consequences. For instance, a minor crack in an oil pipeline might go unnoticed, eventually leading to a major leak, environmental harm, and costly cleanup efforts. Similarly, in the nuclear industry, undetected degradation in reactor cooling systems could cause overheating and potentially catastrophic failure. This paper focuses on reliability modeling for systems experiencing degradation, accounting for time delays associated with undetected degraded states, self-repair mechanisms, and varying operating environments. The paper presents a reliability model for degraded, time-dependent systems, incorporating various aspects of degradation. It first discusses the model assumptions and formulation, followed by numerical results obtained from system modeling using the developed program. Various scenarios are illustrated, incorporating time delays and different parameter values. Through computational analysis of these complex systems, we observe that the probability of the system being in the undetected degraded state tends to stabilize shortly after the initial degradation begins. The model is valuable for predicting and establishing an upper bound on the probability of the undetected, degraded state and the system’s overall reliability. Finally, the paper outlines potential avenues for future research.

Suggested Citation

  • Hoang Pham, 2024. "Reliability Modeling of Systems with Undetected Degradation Considering Time Delays, Self-Repair, and Random Operating Environments," Mathematics, MDPI, vol. 12(18), pages 1-20, September.
  • Handle: RePEc:gam:jmathe:v:12:y:2024:i:18:p:2916-:d:1481312
    as

    Download full text from publisher

    File URL: https://www.mdpi.com/2227-7390/12/18/2916/pdf
    Download Restriction: no

    File URL: https://www.mdpi.com/2227-7390/12/18/2916/
    Download Restriction: no
    ---><---

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:gam:jmathe:v:12:y:2024:i:18:p:2916-:d:1481312. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: MDPI Indexing Manager (email available below). General contact details of provider: https://www.mdpi.com .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.