IDEAS home Printed from https://ideas.repec.org/a/gam/jeners/v18y2025i7p1725-d1624076.html
   My bibliography  Save this article

Reliability Analysis of Transient Voltage Suppression Diodes Under Direct Current Switching Surge Stress

Author

Listed:
  • Daniel van Niekerk

    (Department of Electrical and Electronic Engineering Technology, University of Johannesburg, Johannesburg 2028, South Africa)

  • Johan Venter

    (Department of Electrical and Electronic Engineering Technology, University of Johannesburg, Johannesburg 2028, South Africa)

Abstract

This study examined the dependability of Transient Voltage Suppression (TVS) diodes under direct current (DC) switching surge stress from several manufacturers with identical electrical requirements. To prevent thermal damage, we applied a standard 3 ms DC switching surge and increased the surge voltage in increments of 0.1 V with intervals between surges. The breakdown voltage (V BR ) was measured after each DC switching surge to verify functionality. To find the maximum surge current and power level that each device could withstand before failing to clamp surge voltage at a defined V BR level, three separate manufacturers’ TVS diode (V BR = 6.8 V) samples were examined. There were significant variations in the computed maximum average surge current and power level between manufacturers’ samples determined by statistical analysis. Prior to failure, the average surge power was 202 W, 321 W, and 357 W, while the maximum average surge current was 29.0 A, 46.9 A, and 51.8 A, respectively. Computed 95% confidence interval ranges between manufacturers of TVS diodes revealed significant population reliability differences under DC switching surge stress. Therefore, an efficient TVS diode reliability metric for DC switching surge stress is the maximum average surge current and power immediately before device failure.

Suggested Citation

  • Daniel van Niekerk & Johan Venter, 2025. "Reliability Analysis of Transient Voltage Suppression Diodes Under Direct Current Switching Surge Stress," Energies, MDPI, vol. 18(7), pages 1-20, March.
  • Handle: RePEc:gam:jeners:v:18:y:2025:i:7:p:1725-:d:1624076
    as

    Download full text from publisher

    File URL: https://www.mdpi.com/1996-1073/18/7/1725/pdf
    Download Restriction: no

    File URL: https://www.mdpi.com/1996-1073/18/7/1725/
    Download Restriction: no
    ---><---

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:gam:jeners:v:18:y:2025:i:7:p:1725-:d:1624076. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: MDPI Indexing Manager (email available below). General contact details of provider: https://www.mdpi.com .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.