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Semiconductor Material Damage Mechanisms Due to Non-Ionizing Energy in Space-Based Solar Systems

Author

Listed:
  • Anthony Peters

    (School of Engineering and Applied Science, Columbia University, New York, NY 10027, USA)

  • Matthias Preindl

    (School of Engineering and Applied Science, Columbia University, New York, NY 10027, USA)

  • Vasilis Fthenakis

    (School of Engineering and Applied Science, Columbia University, New York, NY 10027, USA
    Brookhaven National Laboratory, Upton, NY 11973, USA)

Abstract

Radiation impacts on space-based systems operating on various orbits are evaluated in this paper. Specifically, satellite operations in Low Earth Orbit (LEO), Medium Earth Orbit (MEO), and Geosynchronous Orbit (GEO) are analyzed. Special focus is given on quantifying the effect of high-energy particle space radiation on materials used for critical power components, where component fault can lead to total mission failure. Methods, using multiple computational platforms for the quantification of non-ionizing energy loss (NIEL) and displacement damage dose (DDD), are used to assess semiconductor damage at specific orbital altitudes. Detailed simulations were conducted for Gallium Arsenide Indium Phosphide (GaInP/GaAs/Ge) solar cells with various cover glass thicknesses, and the survivability of GaInP/GaAs/Ge cells was compared with that of Si cells. It was assessed that radiation exposure due to high-energy protons at 10,000 km is more prevalent than 20,000 km orbits and that electron bombardment is a major electronic damage culprit. For MEO at 10,000 km, MEO at 20,000 km, and GEO at 36,000 km, we determined the 1-year maximum power (Pmax) losses due to protons to be 23%, 8%, and 1% and losses due to electrons to be 11%, 14%, and 10%. Total integrated spectra Pmax losses for those altitudes are 25%, 16%, and 10%, respectively.

Suggested Citation

  • Anthony Peters & Matthias Preindl & Vasilis Fthenakis, 2025. "Semiconductor Material Damage Mechanisms Due to Non-Ionizing Energy in Space-Based Solar Systems," Energies, MDPI, vol. 18(3), pages 1-16, January.
    • Handle: RePEc:gam:jeners:v:18:y:2025:i:3:p:509-:d:1574171
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